Job Specification - HORIBA

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United States

Scientific and Analytical Instruments

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應用
Technologies
- Spectroscopy
  Cathodoluminescence
  Raman Spectroscopy
  AFM-Raman
  Fluorescence Spectroscopy
  Photoluminescence Spectroscopy
  Diffraction Gratings
  Monochromator and Spectrograph
  Detectors
  X-ray Fluorescence Spectroscopy (XRF)
  Spectroscopic Ellipsometry
- Microscopy and Imaging
  Raman Microscopy
  Cathodoluminescence
  Atomic Force Microscopy [AFM]
  AFM-Raman
  Nanoparticle Tracking Analysis
- Particle Analysis
  Dynamic Light Scattering
  Static Light Scattering
  Molecular Weight
  Zeta Potential
  Image Analysis of Particles
  Nanoparticle Tracking Analysis
  Centrifugal Sedimentation
- Elemental Analysis
  Glow Discharge Optical Emission Spectroscopy (GDOES)
  Inductively Coupled Plasma - Optical Emission Spectroscopy (ICP-OES)
  Carbon/Sulfur & Oxygen/Nitrogen/Hydrogen Analysis
  X-ray Fluorescence Spectroscopy (XRF)
- Surface Plasmon Resonance
  Surface Plasmon Resonance imaging
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Glow Discharge Spectroscopy
Pressure-based Flowmetry
Quadrupole Mass Spectrometry
Raman Spectroscopy

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