Chemical Speciation of Particulate Matter from Steel and Refining Plants

具有 X 射線的連續顆粒監測儀
透過自動採樣進行連續元素和顆粒品質分析
人們越來越關注顆粒物 (PM) 污染及其對健康的影響。對於有效的預防措施,源頭PM濃度的測定極為重要。因此,PM 和元素濃度的指示至關重要。 PX-375 分析儀採用自動採樣、連續線上 PM 定量和定性分析來快速測量空氣污染。
透過單一裝置直接在現場連續分析 PM 質量和元素濃度。
採用世界公認的技術:X 射線螢光和 Beta 射線衰減。
HORIBA 的濾帶提供出色的靈敏度和精確的性能
安裝的 CMOS 攝影機可以觀察過濾器收集的顆粒樣本。使用者友好的顯示和操作
<表1>最低檢測極限(範例)(2σ)(ng/m3)
* LDL (σ) is half of the LDL (2σ)
<表2>可檢測元素
* O - 標準參數,由標準校準材料校準。
* 對於元素濃度的測量,需要使用標準校準材料進行校準。
* 對於標記為不可偵測的元素,請單獨聯絡。 產品的規格、外觀或其他方面如有變更,恕不另行通知。如果您喜歡演示,請聯絡我們考慮購買該產品。
相關文章(利用 PX-375 的研究論文列表)
Product name | Continuous Particulate Monitor with X-ray Fluorescence |
---|---|
Model | PX-375 |
Measured object | Particulate matter (PM10, PM2.5, TSP) |
Measurement content | Particulate mass concentration and element concentration |
Flow rate | 16.7L/min |
---|---|
Sampling pump | Linear drive system, externally installed |
Filter tape | None-woven PTFE fabric filter |
Spot tape interval | 20/25/50/100mm selectable |
Filter tape replacement interval | Approx. 1 month (In case of 100mm spot interval) |
Ambient operation temperature | 10˚C~30˚C |
Relative humidity | 0~80% RH noncondensing |
Altitude | 1000m or less |
Power supply | AC100V~240V ±10%, 50/60Hz±1% |
Power consumption | Approx. 400VA |
External dimension | 430mm(W)×550mm(D)×285mm(H) (without sampling pipe and measurement head) |
Weight | Approx. 40kg (Without sampling pipe and measurement head) |
Data output | CSV file (Average PM mass and elemental concentration) |
External connection | EthernetTM, USB, RS-232C* (option) |
*Please consult about communication and instrument composition separately.
Measurement method | Beta-ray attenuation |
---|---|
PM10 | US EPA Louvered PM10 Inlet |
PM2.5 | BGI VSCCTM Cyclone |
TSP | TSP Inlet |
Measurement range | 0~200/500/1000μg/m3 |
Repeatability | ±2% (against reference foil value) |
Span drift | ±3% (24hours) |
Lowest detection limit (2σ) | ±4μg/m3 (24hours) |
Sampling and measurement cycle | 0.5/1/2/3/4/6/8/12/24 hours |
Measurement method | Energy dispersive X-ray spectroscopy |
---|---|
Detectable elements | See Table 2 "Detectable Elements". Standard parameter is S, Ti, Cr, Mn, Ni, Cu, Zn, Pb, Al, Si, K, Ca, V, Fe, As. |
Primary X-ray filter | Automatic switching for light metals/heavy metals |
Tube voltage | Automatic switching for 15kV/50kV |
Detector | SDD (Silicon Drift Detector) |
Sample image | CMOS camera |
Lowest detection limit (2σ) | Recommended EPA Method IO 3.3 See Table 1 "Lowest Detection Limit (Example)" |
Measurement range | Up to measurement time |
Analysis time | 1000s (16.6 min) as standard 100 / 200 / 500 / 1000 / 2000 / 5000 / 10000s selectable |
Calibration material for X-ray intensity for standard parameter | NIST SRM 2783, other materials (option) |
Safety functions for X-ray | Internal lock system Key switch X-ray indication light |
There are no results for this filter combination!
如您有任何疑問,请在此留下詳細需求或問題,我們將竭誠您服務。