There is a local version available of this page. Change to the local version?
United States

Semiconductors

CMP slurry dispersibility analysis

Particle dispersion analysis in slurry stock solution

For quality control of CMP slurry, we were able to quickly distinguish between OK products with a size of 100 nm or less and coarse particles (NG products) with a size of around a few μm.

Request for Information

Do you have any questions or requests? Use this form to contact our specialists.

* These fields are mandatory.

You might also like to know