Particle Detection - HORIBA
There is a local version available of this page. Change to the local version?
United States

Particle Detection

Comprehensive Particle Detection for Semiconductor Manufacturing Processes

For Semiconductor manufacturing processes, where the most advanced micro-fabrication techniques are used, quality management is a critical issue that directly impacts business.

It is important to constantly inspect for the presence of particle contamination. By making use of advanced analysis technologies, HORIBA provides cost effective leading-edge particle detection solution to semiconductor manufactures.

Request for Information

Do you have any questions or requests? Use this form to contact our specialists.

* These fields are mandatory.

Corporate