History timeline 1930–1959 - HORIBA
There is a local version available of this page. Change to the local version?
United States
OK
Scientific and Analytical Instruments
Search
English
Corporate
Russia
Продукты
Raman Imaging and Spectrometers
Raman Research Solutions
Raman Analytical Solutions
Raman Building Blocks
Raman Application Corner
Raman Academy
Browse Products
LabRAM Soleil
LabRAM HR Evolution
XploRA PLUS
LabSpec 6 Spectroscopy Suite Software
AFM Optical Platform
Browse Products
SignatureSPM
OmegaScope
SmartSPM
TRIOS
XploRA Nano
LabRAM Nano
LabRAM Soleil Nano
CombiScope
Fluorescence Spectrometers
Steady State Fluorescence
Fluorescence Lifetimes with TCSPC
Fluorescence Microscopy
Browse Products
Aqualog
DeltaFlex TCSPC
DeltaPro TCSPC
Duetta
FLIMera
Fluorolog-QM
FluoroMax
InverTau
Nanolog
X-ray Fluorescence Analyzers [XRF]
Application corner
XGT-9000 | X-ray Analytical Microscope
XGT-9000SL | X-ray Analytical Microscope Super Large Chamber Model
MESA-50 | X-Ray Fluorescence Analyzer
MESA-50K | X-Ray Fluorescence Analyzer
Glow Discharge Optical Emission Spectrometry (GDOES)
GD-Profiler 2
ICP-OES Spectrometers
Ultima Expert
Ultima Expert LT
Carbon, Sulfur, Oxygen, Nitrogen and Hydrogen Analyzers
Application corner
EMIA-Pro | C/S Analyzer
EMIA-Expert | C/S Analyzer
EMIA-Step | C/S Analyzer
EMGA-Pro | O/N/H Analyzer
EMGA-Expert | O/N/H Analyzer
EMGA-920 | O/N Analyzer
EMGA-921 | H Analyzer
EMGA-930 | O/N/H Analyzer
Sulfur-in-Oil
Sulfur-in-Oil Home
Energy Dispersive X-ray Fluorescence
Combustion Elemental Analysis
Browse All Products
SLFA-60
SLFA-6000
MESA-7220V2
MESA-7220
X-5000
XPLORER-NS
XPLORER-TX/TS
Particle Characterization
Particle Size
Particle Shape
Zeta Potential
Surface Area
Particle Concentration
Browse All Products
Partica LA-960V2
Partica mini LA-350
ViewSizer 3000
nanoPartica SZ-100V2 Series
Eyecon2™
PSA300
SA-9600 Series
Custom Spectroscopy Solutions
Modular Raman
Photoluminescence
Microscope Spectrometers
Darkfield Scattering
Electroluminescence and Photocurrent
Reflectance and Transmittance
Time-resolved Photoluminescence (Lifetime)
Micro-Photoluminescence
Raman Microspectroscopy
Semiconductor Large Wafer Analysis
Time Resolved Fluorescence
Cathodoluminescence
Light Sources
Spectrometers and Monochromators
Scientific Cameras and Single Channel Detectors
Mini-Spectrometers and Scientific Cameras for OEMs
Grating Spectrometers
OEM Deep-Cooled Scientific Cameras
Browse Products
Compact VUV CCD Spectrometer
Hyperspectral Imaging System
Imaging Scanning Monochromator
Miniature Spectrometers
Mini Raman Spectrometers
Multispectra Spectrometers
OES Spectrometers
PoliSpectra RPR Raman Plate Reader
UV-Vis-NIR Spectrometers
Diffraction Gratings for Industrial OEM and Scientific Research
Gratings for Industrial OEM
Gratings for Scientific Research
Browse Products
Blazed holographic plane gratings
Flat field and imaging gratings - Type IV
Gratings - Laser Pulse Compression Gratings
Gratings for astronomy
Gratings for Space-Flight
Gratings for Synchrotron, FEL and EUV light sources
Holographic concave gratings - Type I
Holographic plane gratings
Monochromator gratings - Type IV
Ruled plane gratings
Surface Plasmon Resonance imaging (SPRi)
OpenPleX
SPRi-Arrayer
Spectroscopic Ellipsometry
UVISEL Plus
Auto SE
Smart SE
Forensics
Forensics Light Sources
RUVIS
Imaging
AFIS
Goggles & Camera Filters
Browse Products
CrimeScope CS-16-500W | Forensic Light Source
FOCUS PRO | Forensic Light Source
Mini-CrimeScope Advance | Forensic Light Source
SceneScope RUVIS UHD | Imaging System
Universal Imaging System
PrintQuest
Применение
Automotive & Aeronautics
Semiconductors
Material Sciences
Biotechnology & Biomedical
Pharmaceutical
Biopharma
Cosmetics
Food & Beverage
Environment
Energy
Chemistry
Metallurgy
Others
Технологии
Spectroscopy
Cathodoluminescence
Raman Spectroscopy
AFM-Raman
Fluorescence Spectroscopy
Photoluminescence Spectroscopy
Vaccum Ultra Violet
Diffraction Gratings
Monochromator and Spectrograph
Detectors
X-ray Fluorescence Spectroscopy (XRF)
Spectroscopic Ellipsometry
Microscopy and Imaging
Raman Microscopy
Cathodoluminescence
Atomic Force Microscopy [AFM]
AFM-Raman
Nanoparticle Tracking Analysis
Electrochemistry
The Story of pH (Link to dedicated website)
The Story of Ion
The Story of ORP
The Story of Conductivity
The Story of Salt
The Story of Dissolved Oxygen
Physisorption
Surface Area Measurements
Particle Analysis
Dynamic Light Scattering
Static Light Scattering
Molecular Weight
Zeta Potential
Image Analysis of Particles
Nanoparticle Tracking Analysis
Centrifugal Sedimentation
Elemental Analysis
Glow Discharge Optical Emission Spectroscopy (GDOES)
Inductively Coupled Plasma - Optical Emission Spectroscopy (ICP-OES)
Carbon/Sulfur & Oxygen/Nitrogen/Hydrogen Analysis
X-ray Fluorescence Spectroscopy (XRF)
Surface Plasmon Resonance
Surface Plasmon Resonance imaging
Resources
eBooks
Webinars
Videos On Demand
Science in Action Series
Women in Science Series
Spectroscopy Matters
Jobin Yvon History - 200 Years of Optical Innovation
Events
Career
Support
Worldwide Locations
Контакты
Country / Region
International
Brasil
中国
Česko
France
Deutschland
Österreich
India
日本
한국
Polska
Россия
Singapore
España
台灣
United Kingdom
United States
Change
Contact us
Find us
Jobin Yvon History
Jobin Yvon History - 200 Years of Innovation
Introduction
History timeline 1819–1899
History timeline 1900–1929
History timeline 1930–1959
History timeline 1960–1989
History timeline 1990–2009
History timeline 2010 to present
Instrumentation 1819-1874
Instrumentation 1882-1930
Instrumentation 1931-1972
Instrumentation 1972-1989
Instrumentation 1990-2018
Places of Interest
Our Gratings in Space
Resources
»
History timeline 1930–1959
History timeline 1930–1959
1930
1930
Move to Arcueil (France)
1930
Lecomte du Noüy tensiometer
1932
Jobin Yvon precision polarimeter with Bruhat monochromator (1932)
1942
Incorporation as Jobin Yvon
1945
Meunier electrophotometer
1946
Jacques Millot
1955
Jules-Jean Chauvin
1959
<< 1900–1929
1960–1989 >>
Corporate