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Semiconductors

SiC carrier lifetime analysis

Carrier lifetime analysis of different SiC film formation conditions by PL lifetime measurement

Substrates with a large amount of dopant have a short PL lifetime and a PL peak appears around 500 nm.

Fluorescence lifetime measurement device DeltaFlex

  • Observe differences in carrier life by measuring PL life
  • Diverse light source wavelength repertoire
  • Supports a wide range of PL life from picoseconds to several seconds
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DeltaFlex
DeltaFlex

형광수명측정기

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