There is a local version available of this page. Change to the local version?
United States

Metals

Analytical Needs for Metals

<< Back to Metals

In the realm of advanced materials, primary metals are critical for fields such as aerospace, automotive, electronics, and medical devices. Ensuring the quality and performance of these metals requires extensive analysis.

Elemental Analysis

Elemental analysis of metals involves a suite of advanced techniques to determine the composition, distribution, and depth profile of elements within metal samples, providing critical insights for applications in material science, manufacturing, and quality control.

Depth Profiling

By providing detailed information about the distribution of elements as a function of depth, Glow Discharge Optical Emission Spectroscopy (GDOES) is ideal for trace element analysis and analysis of metal coatings, and helps in understanding material properties, improving manufacturing processes, and ensuring quality control.

Distribution Analysis

Single-, multi-point elemental analysis and elemental mapping analysis can be performed using µ-XRF, which focuses X-rays and enables elemental analysis of small areas.

Structural Analysis

Raman spectroscopy and other spectroscopic techniques can be used to analyze the crystal structure and microstructure of metal oxides and metal complexes which are easily distinguished by their characteristic spectra.

Surface Analysis

Atomic Force Microscopy (AFM) can assess surface roughness, coatings, and treatments to ensure proper adhesion, corrosion resistance, and overall surface integrity.

    HORIBA Solutions

    HORIBA provides advanced analytical instruments and solutions that significantly aid in the analysis of metals.

    EMIA-Expert
    EMIA-Expert

    탄소/황 분석기

    EMGA-Expert
    EMGA-Expert

    산소/질소/수소 분석기

    GD-Profiler 2™
    GD-Profiler 2™

    Glow Discharge Optical Emission Spectrometer

    XGT-9000
    XGT-9000

    X선 분석 현미경(Micro-XRF)

    Partica LA-960V2
    Partica LA-960V2

    레이저 산란 입자 크기 분포 분석기

    nanoPartica SZ-100V2 Series
    nanoPartica SZ-100V2 Series

    나노입자 분석기

    LabRAM Soleil
    LabRAM Soleil

    Raman Microscope

    SignatureSPM
    SignatureSPM

    Scanning Probe Microscope with Chemical Signature

    SA-9600 Series
    SA-9600 Series

    BET Flowing Gas Surface Area Analyzers

    EMIA-Pro
    EMIA-Pro

    탄소/유황 분석기

    EMGA-Pro
    EMGA-Pro

    산소/질소/수소 분석기

    ViewSizer 3000
    ViewSizer 3000

    멀티 레이저 나노 입자 추적 분석기

    MESA-50
    MESA-50

    X선 형광 분석기

    XploRA™ PLUS
    XploRA™ PLUS

    Raman Spectrometer - Confocal Raman Microscope

    Show More

    제품 문의

    HORIBA제품의 자세한 정보를 원하시면, 아래의 양식에 내용을 입력을 부탁드립니다.

    * 는 필수입력항목입니다.