Raman images of polystyrene (PS) beads were recorded to demonstrate the spatial resolution of the instrument at submicron scale. The sample was purchased from NIST with certified nominal diameters (~2.77 μm). They were placed on a Si substrate and point mapped with 100 nm step. Multivariate analysis was performed on the spectral features of PS to create a Raman image of PS (x- and y-axes plot distance and z-axis scores).