There is a local version available of this page. Change to the local version?

United States

AFM

Plateforme optique AFM

Conçue pour être combinée à des spectroscopies optiques

La plateforme AFM permet d'utiliser la microscopie confocale Raman et l'AFM de façon entièrement intégrée pour les spectroscopies optiques exaltées par effet de pointe, telles que la spectroscopie Raman exaltée par effet de pointe (TERS) ou la photoluminescence exaltée par effet de pointe (TEPL), mais aussi pour les mesures AFM-Raman colocalisées.

Les nombreuses techniques AFM (microscopie à force atomique) qui permettent d'étudier les propriétés topographiques, électriques et mécaniques sont compatibles avec toutes les sources laser disponibles dans un spectromètre Raman, ou avec une autre illumination externe (par exemple, un simulateur solaire ou une autre source réglable ou continue). Les spectroscopies TERS et TEPL peuvent fournir des informations chimiques et structurelles à l'échelle nanométrique, faisant de la plateforme AFM-Raman un système bidirectionnel au sein duquel des techniques complémentaires s'échangent de nouvelles fonctions uniques d'imagerie.

Téléchargez notre eBook (en anglais) AFM-Raman/TERS !

Présentation de l'AFM-Raman

Solutions de nano-spectroscopie avec AFM-Raman, TERS, NSOM

La technologie Raman de pointe d'HORIBA est désormais intégrée à la microscopie à force atomique (AFM). Résultat : une caractérisation plus complète des échantillons avec un seul instrument polyvalent, pour des mesures rapides et simultanées de l'AFM-Raman colocalisé, de la spectroscopie Raman exaltée par effet de pointe (TERS) et de la photoluminescence exaltée par effet de pointe (TEPL).

Webinaire NanoRaman

Spectroscopie optique exaltée par effet de pointe et SPM corrélées

Ce webinaire présente de nouvelles capacités de nano-imagerie. Les spectroscopies optiques exaltées par effet de pointe (TEOS), telles que la spectroscopie Raman exaltée par effet de pointe (TERS) et la photoluminescence exaltée par effet de pointe (TEPL), offrent des fonctions uniques de caractérisation des molécules, des matériaux 1D et 2D, des nanostructures semi-conductrices et des biomatériaux.

Technologie et FAQ

AFM-Raman (mesures colocalisées & TERS)

Avec la TERS, la spectroscopie Raman passe à l'échelle nanométrique. En savoir plus sur cette technique d'imagerie chimique super résolution.

Témoignages

« [...] Grâce à la culture orientée client d'HORIBA, l'équipe nano-Raman du LPICM procède actuellement à la mise à jour de son prototype « historique » avec le nouveau système TERS. Cela nous permettra [...] de nous lancer dans de nouveaux domaines de recherche, ce que nous ne pouvons pas faire avec le système actuel. »
Prof. Razvigor OSSIKOVSKI, responsable d'équipe nano-Raman, LPICM, École Polytechnique, France

Publications des utilisateurs

Accédez à la liste des publications des utilisateurs de l'AFM-Raman et découvrez comment les techniques TERS et TEPL révolutionnent la recherche scientifique.

Formations AFM-Raman

Nos formateurs sont des experts de la technique AFM-Raman. Vous bénéficierez de formations et de conseils pour tirer le meilleur parti de votre instrument HORIBA Scientific. Vous gagnerez en confiance et en expérience dans l'analyse de vos échantillons.

Actualités

Correlated TERS, TEPL and SPM Measurements of 2D Materials

This application note reports on nano-characterization of 2D transition metal dichalcogenides (TMDCs) materials which are considered of very high potential semiconductors for future nanosized electronic and optoelectronic devices. Scanning probe microscopy giving access to the critical topographic and electronic properties at the nanoscale is coupled to photoluminescence (PL) and Raman spectroscopies by means of plasmon enhancement to yield correlated electrical and chemical information down to the nanoscale.

RamanFest 2025

The 12th International Conference on Advanced Applied Raman Spectroscopy (RamanFest 2025) will feature presentations from world-leading Raman experts and researchers using the technique across varied applications within life science, materials science, and energy and environmental analysis. It will bring together the world's Raman community to share, learn and discuss how Raman spectroscopy is being applied to today's problems, and pioneering tomorrow's capabilities.

Discover Recent Advances in TERS Imaging of 2D Materials

In this webinar, a number of exciting developments in the tip-enhanced Raman spectroscopy (TERS) field will be discussed, including non–trivial excitation wavelength dependence of the gap-mode TERS response of transition metal dichalcogenides (TMDs) on silver that resulted in reconsidering the role of resonance effects and strong optical coupling in TERS and completely unexpected discovery of the normally forbidden Raman bands in TERS spectra of the monolayer h-BN on gold caused by the proximity of TMD monolayer to multiple layers exfoliated on top...

Watch it now

Simultaneous structural and chemical characterization with colocalized AFM-Raman

The combination of Atomic Force Microscopy (AFM) and Raman spectroscopy provides deep insights into the complex properties of various materials. While Raman spectroscopy facilitates the chemical characterization of compounds, interfaces and complex matrices, offering crucial insights into molecular structures and compositions, including microscale contaminants and trace materials. AFM provides essential data on topography and mechanical properties, such as surface texture, adhesion, roughness, and stiffness at the nanoscale.

Watch it now

Webinar: Characterizing semiconductor materials by optical microspectroscopies

The growing of semiconductor materials industrialization requires technologies to characterize their properties. Optical microspectroscopic platforms like Raman microscopes offer both physical and chemical information in one system. Thus, process qualification, wafer uniformity assessment, or defects inspection of wafers can be achieved with Raman microscopy. These can also be applied to new materials characterization.

In this webinar, we will highlight how Photoluminescence and Raman microscopies can address semiconductor challenges. We will also show how the combination of micro-spectroscopies with AFM (Atomic Force Microscopy) can provide nano resolution and deeper understanding of these structures.

Watch it now

Colocalized AFM-Raman Analysis of 2D Materials Heterostructures

True colocalized topographic, electrical, and chemical characterization of Van der Waals heterostructures

Van der Waals heterostructures, with their unique properties arising from the weak interlayer coupling and strong in-plane bonding, offer exciting opportunities for the design of novel materials with tailored electronic, optical, and mechanical properties.

TERS Characterization of Lipid Nanotubes as Carbonaceous Material for Electrodes

TERS characterization of pyrolyzed lipid nanotubes for the fabrication of nano-electrodes

For thirty years there has been a research focused onto carbonization of 3D structures especially to be employed in electronic applications. These structures are prepared with the help of lithography and pyrolyzed afterwards. For making features below 100 nm, a bottom-up approach using lipids nanotubes is attempted.

TERS Characterization of Single- to Few-Layer Ti₃C₂Tₓ MXene

Nanoscale chemical imaging of Single- to Few-Layer Ti₃C₂Tₓ MXene

MXenes is the largest and fastest growing 2D materials. They have unique properties such as good conductivity and a hydrophilic surface. The control of nanoscale composition would ultimately allow for engineering properties locally, gaining more control over the 2D material-based systems.

TERS on Functionalized Gold Nanostructures for Nano-scale Biosensing

TERS Nano-localization of SERS hot spots

Surface-enhanced Raman scattering (SERS) is a powerful plasmonics-based analytical technique for biosensing. SERS effect relies on nanostructures that need to be designed to maximize enhancement factors and molecular specificity. In addition to numerical modeling, an analytical tool capable of imaging localized enhancement would be an added value.

TERS Characterization of phospholipid bilayers and detection of nanoparticles

Non-destructive and label-free hyperspectral chemical imaging of phospholipid bilayers with spatial resolution of 7 nm

Phospholipid bilayers, major constituents of membranes act as a barrier of selective permeability for the nanoparticles now largely into our environment. Studying the interactions between nanoparticles and cellular membranes requires a molecular chemical probe with nanometer resolution capability.

Correlated TERS and KPFM of Graphene Oxide Flakes

AFM-Raman and its TERS mode are used to show nanoscale surface mapping of structural defects and chemical groups on graphene oxide (GO) flakes with 10 nm spatial resolution. TERS mapping is combined with Kelvin probe force microscopy measurements for simultaneous topographical, electronic and chemical imaging of GO surface. The multi-parameter measurement methodology proposed in this note extends the capability of TERS allowing a direct correlation of local chemical composition and physical properties at the nanoscale not only for 2D materials but for almost any sample surface.

AFM-TERS measurements in a liquid environment with side illumination/collection

This application note reveals the key instrumental details to succeed in TERS measurements in liquids using side illumination/collection geometry. Such capability aims at bringing breakthroughs in many applications such as heterogeneous catalysis, electrochemistry, cellular biology and biomaterials. In this note, nanoscale chemical imaging of graphene oxide flakes and carbon nanotubes immersed in water is demonstrated with a TERS resolution down to 20 nm along with true non-contact AFM images.