There is a local version available of this page. Change to the local version?
United States
Semiconductor Page Heading

颗粒检测系统

Particle Detection System

Comprehensive Particle Detection for Semiconductor Manufacturing Processes

For Semiconductor manufacturing processes, where the most advanced micro-fabrication techniques are used, quality management is a critical issue that directly impacts business.

It is important to constantly inspect for the presence of particle contamination. By making use of advanced analysis technologies, HORIBA provides cost effective leading-edge particle detection solution to semiconductor manufactures.

留言咨询

如您有任何疑问,请在此留下详细需求信息,我们将竭诚为您服务。

* 这些字段为必填项。

Corporate