Material Characterization

Ultra-thin film makes it difficult to measure film thickness and refractive index

Exhibition Panels

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1.08 MB
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Material & Thin Film Characterization

Various analytical measurement technologies for evaluation of physical properties and thin films

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3.29 MB
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Chemical Mechanical Planarization

Various analytical measurement technologies in the CMP process

Product Catalogs

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3.18 MB
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Scientific Product Navi

Your Partner in Science

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4.34 MB
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Semiconductor Navi

Smart Car

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1.49 MB
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Raman Navi

Product Lineup of Raman Spectroscopy

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6.76 MB
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Raman Spectrometer

LabRAM HR Evolution

 

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7.24 MB
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Raman Microscope

LabRAM Soleil

 

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10.61 MB
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AFM Raman

Nano Raman

 

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1.11 MB
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Raman Spectrometer

MacroRAM

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4.09 MB
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Ellipsometer for Thin Film Measurements

UVISEL Plus

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1.75 MB
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Spectroscopic Ellipsometer for Simple Thin Film Measurement

Auto SE

 

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5.85 MB
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Glow Discharge Optical Emission Spectrometer

GD Profiler

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5.18 MB
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Cathodoluminescense

CLUE Series

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5.14 MB
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Fluorescence Spectrometer

Fluorolog QM

 

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5.28 MB
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TCSPC Lifetime Fluorometer

DeltaFlex

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1.7 MB
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Fluorescence and Absorbance Spectrometer

Duetta

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1.85 MB
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Centrifugal Nanoparticle Analyzer

Partica CENTRIFUGE

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1.52 MB
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Nanoparticle Analyzer

Nano Partica SZ-100V2 Series

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1.52 MB
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Laser Scattering Particle Size Distribution Analyzer

Partica LA-960V2

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1.52 MB
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Laser Scattering Particle Size Distribution Analyzer

Partica LA-960V2 Series Optional

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6.71 MB
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Oxygen & Nitrogen Analyser

EMGA-Pro / Expert

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1.84 MB
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X-Ray Analytical Microscope

XGT-9000

Informationsanfrage

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