LabRAM Odyssey Nano

AFM-Raman for physical and chemical imaging

Fully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM Odyssey fully automated Raman micro-spectrometer. LabRAM Odyssey Nano offers full automation and versatile compatibility with outstanding performance.

The LabRAM Odyssey Nano brings ease-of-use and extreme flexibility together for the most demanding applications. With capabilities from deep UV to infrared, high spectral resolution, and an extended set of options and accessories, the LabRAM Odyssey Nano is ideally suited to perform in any of your research challenge.

Segment: Scientific

Division: AFM and AFM-Raman

Manufacturing Company: HORIBA France SAS

Multi-sample analysis platform

Macro, micro and nano scale measurements can be performed on the same platform.

Ease-of-use

Fully automated operation, start measuring within minutes, not hours!

True confocality

High spatial resolution, automated mapping stages, full microscope visualization options.

High collection efficiency

Top-down and oblique Raman detection for optimum resolution and throughput in both co-localized and Tip-Enhanced measurements (Raman and Photoluminescence).

High spectral resolution

Ultimate spectral resolution performance, multiple gratings with automated switching, wide spectral range analysis for Raman and PL.

High spatial resolution

Nanoscale spectroscopic resolution (down to 10 nm) through Tip Enhanced Optical Spectroscopies (Raman and PhotoLuminescence).

Multi-technique / Multi-environment

Numerous SPM modes including AFM, conductive and electrical modes (cAFM, KPFM), STM, liquid cell and electrochemical environment, together with chemical mapping through TERS/TEPL. Full control of the 2 instruments through one workstation and a powerful software control, SPM and spectrometer can be operated simultaneously or independently

Robustness / Stability

High resonance frequency AFM scanners, operation far away from noises! High performance is obtained without active vibration isolation.

SmartSPM Scanner and Base

Sample scanning range: 100 µm x 100 µm x 15 µm (±10 %)

Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %

Noise: 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth

Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)

X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm

Sample size: Maximum 40 x 50 mm, 15 mm thickness

Sample positioning: Motorized sample positioning range 5 x 5 mm

Positioning resolution: 1 µm

AFM Head

Laser wavelength: 1300 nm, non-interfering with spectroscopic detector

Registration system noise: Down to < 0.1 nm

Alignment: Fully automated cantilever and photodiode alignment

Probe access: Free access to the probe for additional external manipulators and probes

SPM Measuring Modes

Contact AFM in air/(liquid optional); Semicontact AFM in air/(liquid optional); Non -contact AFM; Phase imaging; Lateral Force Microscopy (LFM); Force Modulation; Conductive AFM (optional); Magnetic Force Microscopy (MFM); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Capacitance and Electric Force Microscopy (EFM); Force curve measurement; Piezo Response Force Microscopy (PFM); Nanolithography; Nanomanipulation; STM (optional); Photocurrent Mapping (optional); Volt-ampere characteristic measurements (optional)

Spectroscopy Modes

Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy

Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes

Tip-EnhancedPhotoluminescence (TEPL)

Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)

Conductive AFM Unit (optional)

Current range: 100 fA ÷ 10 µA; 3 current ranges (1 nA, 100 nA and 10 µA) switchable from the software

Optical Access

Capability to use simultaneously top and side plan apochromat objective: Up to 100x, NA = 0.7 from top or side; Up to 20x and 100x simultaneously

Closed loop piezo objective scanner for ultra stable long term spectroscopic laser alignment: Range 20 µm x 20 µm x 15 µm; Resolution: 1 nm

Spectrometer

Fully automated high resolution LabRAM Odyssey micro-spectrometer, functional as stand-alone micro-Raman microscope

Wavelength range: 50 cm^-1to 4000 cm^-1 or down to 10 cm^-1 with Ultra Low Frequency (ULF) filter option

Gratings: Selection of gratings from 150 g/mm to 3600 g/mm; 2 gratings on computer controlled turret, kinematically mounted and easily exchangeable

Optical design: Achromatic spectrograph and achromatic coupling optics

Automation: Fully motorized, software controlled operation

Detection

Full range of CCD detectors and EMCCDs and InfraRed detectors: InGaAs array, single channel extended InGaAs, InSb, CdTe,...

Laser Sources

Wavelengths: Full range of wavelengths from DUV (229 nm) to IR (up to 1064 nm)

Typical wavelength: 532 nm, 638 nm, 785 nm

Automation: Fully automated laser and filter switching for up to 3 simultaneous lasers; Laser polarization selection and spectral analyzer options for all wavelengths

Software

Integrated software package including full featured SPM, spectrometer and data acquisition control, spectroscopic and SPM data analysis and processing suite, including spectral fitting, deconvolution and filtering, optional modules include univariate and multivariate analysis suite (PCA, MCR, HCA, DCA), particle detection and spectral search functionalities.

Colocalized AFM-Raman Analysis of 2D Materials Heterostructures

Van der Waals heterostructures, with their unique properties arising from the weak interlayer coupling and strong in-plane bonding, offer exciting opportunities for the design of novel materials with tailored electronic, optical, and mechanical properties.

Colocalized AFM-Raman Analysis of Graphene

Graphene, a single layer of carbon atoms arranged in a two-dimensional honeycomb lattice, exhibits remarkable electrical, thermal, and mechanical properties, making it a subject of extensive research in various scientific fields.

TERS Characterization of Lipid Nanotubes as Carbonaceous Material for Electrodes

For thirty years there has been a research focused onto carbonization of 3D structures especially to be employed in electronic applications. These structures are prepared with the help of lithography and pyrolyzed afterwards. For making features below 100 nm, a bottom-up approach using lipids nanotubes is attempted.

TERS Characterization of Single- to Few-Layer Ti₃C₂Tₓ MXene

MXenes is the largest and fastest growing 2D materials. They have unique properties such as good conductivity and a hydrophilic surface. The control of nanoscale composition would ultimately allow for engineering properties locally, gaining more control over the 2D material-based systems.

TERS on Functionalized Gold Nanostructures for Nano-scale Biosensing

Surface-enhanced Raman scattering (SERS) is a powerful plasmonics-based analytical technique for biosensing. SERS effect relies on nanostructures that need to be designed to maximize enhancement factors and molecular specificity. In addition to numerical modeling, an analytical tool capable of imaging localized enhancement would be an added value.

TERS Characterization of phospholipid bilayers and detection of nanoparticles

Phospholipid bilayers, major constituents of membranes act as a barrier of selective permeability for the nanoparticles now largely into our environment. Studying the interactions between nanoparticles and cellular membranes requires a molecular chemical probe with nanometer resolution capability.

TERS Characterization of Graphene Nanoribbons

Graphene is foreseen for a handful of electronic and optoelectronic nano-devices. Making nano-devices out of graphene requires nanopatterning. Determining the quality of patterned graphene is essential and the detection of defects demands a sensitive chemical nano-characterization tool.

TERS Characterization of Explosive Nanoparticles

It is not yet understood how co-crystal nanoparticles (co-crystallinity combined with nanostructuring) have superior properties to single compound crystals. Only a technique capable of probing single nanoparticles can bring answers.

c-AFM and in operando TERS & µRaman Characterization of Molecular Switching in Organic Memristors

Emergence of organic memristors has been hindered by poor reproducibility, endurance stability scalability and low switching speed. Knowing the primary driving mechanism at the molecular scale will be the key to improve the robustness and reliability of such organic based devices.

Correlated TERS and KPFM of Graphene Oxide Flakes

Visualizing the distribution of structural defects and functional groups present on the surface of two-dimensional (2D) materials such as graphene oxide challenges the sensitivity and spatial resolution of most advanced analytical techniques.

AFM-TERS measurements in a liquid environment with side illumination/collection

Atomic Force Microscopy (AFM) associated to Raman spectroscopy has proven to be a powerful technique for probing chemical properties at the nanoscale. TERS in liquids will bring promising results in in-situ investigation of biological samples, catalysis and electrochemical reactions.

Characterization of Nanoparticles from Combustion Engine Emission using AFM-TERS

A new concern for human health is now raised by sub-23 nm particles emitted by on-road motor vehicles. Beyond measuring particle number and mass, it is also critical to determine the surface chemical composition of the nanoparticles to understand the potential reactivity with the environment.

Correlated TERS, TEPL and SPM Measurements of 2D Materials

Many challenges remain before the promise of 2D materials is realized in the form of practical nano-devices. An information-rich, nanoscale characterization technique is required to qualify these materials and assist in the deployment of 2D material-based applications.

Characterization of Carbon Nanotubes Using Tip-Enhanced Raman Spectroscopy (TERS)

The use of TERS to reveal the defects density in the structure of CNTs is of interest for a better understanding of the electrical properties of the devices made with such nano-objects. Not only defects concentration but also local chirality changes from the different radial breathing modes, pressure effect and strain distribution can be studied at the single carbon nanotube level through TERS.

Characterization of MoS2 Flakes using TEOS

Both TEPL and TERS images are well correlated with AFM morphological images obtained simultaneously, and all are consistent in revealing the nature (number of layers) of MoS2 flakes. Upon deconvolution, the TEPL signal is even capable of revealing local inhomogeneities within a MoS2 flake of 100 nm size. Kelvin probe measurement supports TEPL and TERS measurements and adds to the power of such tip-enhanced combinative tools. TEOS characterization of 2D materials is likely to contribute to further deployment of these materials into commercial products through a better understanding of their electrical and chemical properties at the nanoscale.